In: Chemistry
Discuss in detail the importance of understanding beam and sample interaction in Scanning Electron Microscopy (SEM)?
Ans :- SEM means " scanning electron microscope"
This is an instrument used to know the three dimensional structure of the sample by applying high energy electron beam.
The main principle involved in SEM is when high energy beam of electrons are interact with the sample then electrons get generates into a sample. During this process we see different types of signals such as " Characters" X rays and secondary electrons, These are from geck scattered from the sample.
During this process we see different types of signals such as " Characters" X rays and secondary electrons, These are from geck scattered from the sample.