Question

 

In the Scanning Electronic Microscope (SEM ), how electrons are scattered from the sample (elastic and inelastic)?

Answer 1

In the Scanning Electronic Microscope the electrons are scattered from the sample elastically by the following ways ..

1...When back-scattered electrons occurs the beam electrons that are reflected from the sample by elastic scattering.In this the resolution of BSE image is less than the SE images because they emerge from the deeper locations with the specimen. In the elastic collision the BSE are often used in the analytical SEM along with the spectra made from the characteristics X rays . Electrons which are scattered elasticity by constituent atoms in a specimen they donot lose energy.In the scanning electronic microscope when a specimen is a crystal, elastically scattered electrons become diffracted waves that travel in specific directions.

2..In the Scanning Electronic Microscope the electrons are scattered from the sample inelastic as follows...

1...if there is loss of energy by the electrons then in the scanning electronic microscope the electrons are scattered inelastic. The travelling speed becomes slower through interaction between electrons and specimen.

The inelastically scattered electrons to be chromatically dispersed both parallel and perpendicular to the optic axis in the scanning electronic microscope. The probability of occurring inelastic scattering is small in the scanning electronic microscope .