In: Chemistry
Discuss how you would optimize topographical and compositional contrast in an SEM.
The backscattered electrons vary in their intensity and direction depending on the topography and composition of the specimen. The contrast of the backscattered electron image is based on several factors such as the atomic number (Z) of the sample material, the acceleration voltage of the primary beam and the specimen angle (tilt) with relation to the primary beam. The optimzation can be carried out by two types of information contained in the backscattered electron image can be separated by electronically pairing the opposing quadrants. It is possible to obtain information on sample composition and topography. Subtraction of the quadrants will offer topographic information, and operating the detector quadrants in pairs and then adding the signals will provide compositional information about the sample. Rotating the signal pairing enables the operator to effectively ‘shine the light’ on the sample from two different directions, over-under and left-right.