In: Physics
Let's look for the design 1st so,
b) The thickness of the anti-reflection coating is chosen so that the wavelength in the dielectric material is one quarter the wavelength of the incoming wave. For a quarter wavelength anti-reflection coating of a transparent material with a refractive index n1 and light incident on the coating with a free-space wavelength λ0, the thickness d1 which causes minimum reflection is calculated by:
d1=λ0 / 4η1
where η1 is the refractive index of anti - reflecting coating,
n0 = 1.5 (encapsulated cell) for unencapsulated cell n0 = 1 (So check in the qs wether its encapsulated cell or unencapsulated)
n2 = 3.435
n1 = 2.2699
therefore, the thickness of Anti reflecting coating will be
d1=λ0 / 4η1
d1= 0.64 (micrometer) / 4*2.2699
solving we get,
d1= 0.08 micrometers
Hence, the thickness of ARC is 0.08 micrometers and refractive index of thin film or ARC is 2.2699.
Now part a)
The reflection of a silicon surface is over 30% due to its high refractive index. The reflectivity, R, between two materials of different refractive indices is determined by:
R=(n0−nsi / n0+nsi)^2
substituting n0 = 1.5 and nsi = 3.435 we get,
R = 0.153
which is around 15%
this is the reflection coefficient (If this is not what you need then please do comment I will be sure with the needful).
Thankyou..!