In: Mechanical Engineering
(a) Explain why XRD (X-Ray Diffraction) and TEM (Transmission Electron Microscopy) techniques are suitable in examining the unit cells and crystal structures of solids. (b) Calculate the expected diffraction angle (θ) for the first order reflection from the (310) planes of BCC chromium (Cr) when a monochromatic X-ray radiation of wavelength (λ) 0.757 Ao is used.