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Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process....

Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process. The data (in angstroms) are: 1264, 1280, 1301, 1300, 1292, 1307, and 1275. Calculate (a) the sample average and (b) sample standard deviation. Round both answers to 1 decimal places.

(a)

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