Question
In: Statistics and Probability
Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process....
Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process. The data (in angstroms) are: 1264, 1280, 1301, 1300, 1292, 1307, and 1275. Calculate (a) the sample average and (b) sample standard deviation. Round both answers to 1 decimal places.
| (a) |
Solutions
orchestra answered 1 year agoRelated Solutions
In a semiconductor manufacturing process, 3 wafers from a lot are tested. Each wafer is classified...
In a semiconductor manufacturing process, 3 wafers from a lot
are tested. Each wafer is classified as pass or
fail (binomial). Assume that the probability that a wafer
passes the test is 0.7 and that the wafers are independent.
a. Fill in the table. Round answers to three decimal places
(i.e. 0.123)
X Wafers Pass
P(X)
X*P(X)
(x-mu)2*P(X)
0
0.027
0
________Answer
1
_______Answer
_________ Answer
0.229
2
0.441
0.882
0.004
3
______Answer
1.029
0.278
b. What is the mean?...
A manufacturing company makes runners for cabinet drawers. To assess the quality of the manufacturing process,...
A manufacturing company makes runners for cabinet drawers. To
assess the quality of the manufacturing process, the company
collected one sample of 300 consecutively manufactured runners each
day for 20 days and counted the number of defective items. The
resulting sample data are:
Sample: 1 2 3 4 5 6 7 8 9
10
Sample Size: 300 300 300 300 300 300 300 300 300
300
Defectives: 8 6
11 15 12
11 9 6 5 4
Based on your previous answers, sketch the p control chart for
your own reference. Now plot all the...
A manufacturing process produces semiconductor chips with a known failure rate of 6.9%. If a random...
A manufacturing process produces semiconductor chips with a
known failure rate of 6.9%. If a random sample of 200 chips is
selected, approximate the probability that at most 10 will be
defective. Use the normal approximation to the binomial with a
correction for continuity. Round your answer to at least three
decimal places. Do not round any intermediate steps.
A manufacturing process produces semiconductor chips with a known failure rate of 6.3%. Assume that the...
A manufacturing process produces semiconductor chips with a
known failure rate of 6.3%. Assume that the chip failures are
independent of one another. You will be producing 2,000 chips
tomorrow.
e. Find the probability that you will produce more than 120
defects.
f. You just learned that you will need to ship 1,860 working
chips out of tomorrow’s production of 2,000. What are the chances
that you will succeed? Will you need to increase the scheduled
number produced?
g. If...
A new process has been developed for applying photoresist to 125-mm silicon wafers used in manufacturing...
A new process has been developed for applying photoresist to
125-mm silicon wafers used in manufacturing integrated circuits.
Ten wafers were tested, and the following photoresist thickness
measurements (in angstroms x1000) were observed:
13.3987, 13.3957, 13.3902, 13.4015, 13.4001, 13.3918, 13.3965,
13.3925, 13.3946, and 13.4002.
(a) Test the hypothesis that mean thickness is 13.4 x 1000Å. Use =
0.05 and assume a two sided
alternative.
(b) Find a 99% two-sided confidence interval on mean photoresist
thickness. Assume that thickness
is normally...
The following are quality control data for a manufacturing process at Kensport Chemical Company. The data...
The following are quality control data for a manufacturing
process at Kensport Chemical Company. The data show the temperature
in degrees centigrade at five points in time during a manufacturing
cycle.
Sample
x
R
1
95.72
1.0
2
95.24
0.9
3
95.18
0.9
4
95.42
0.4
5
95.46
0.5
6
95.32
1.1
7
95.40
1.0
8
95.44
0.3
9
95.08
0.2
10
95.50
0.6
11
95.80
0.6
12
95.22
0.2
13
95.60
1.3
14
95.22
0.5
15
95.04
0.8
16...
The following are quality control data for a manufacturing process at Kensport Chemical Company. The data...
The following are quality control data for a manufacturing
process at Kensport Chemical Company. The data show the temperature
in degrees centigrade at five points in time during a manufacturing
cycle.
Sample
x
R
1
95.72
1.0
2
95.24
0.9
3
95.18
0.9
4
95.46
0.4
5
95.46
0.5
6
95.32
1.1
7
95.40
0.9
8
95.44
0.3
9
95.08
0.2
10
95.50
0.6
11
95.80
0.6
12
95.22
0.2
13
95.56
1.3
14
95.22
0.6
15
95.04
0.8
16...
The following are quality control data for a manufacturing process at Kensport Chemical Company. The data...
The following are quality control data for a manufacturing
process at Kensport Chemical Company. The data show the temperature
in degrees centigrade at five points in time during a manufacturing
cycle.
Sample
x
R
1
95.72
1.0
2
95.24
0.9
3
95.18
0.7
4
95.42
0.4
5
95.46
0.5
6
95.32
1.1
7
95.40
0.9
8
95.44
0.3
9
95.08
0.2
10
95.50
0.6
11
95.80
0.6
12
95.22
0.2
13
95.60
1.3
14
95.22
0.4
15
95.04
0.8
16...
The following are quality control data for a manufacturing process at Bensdork Chemical Company. The data...
The following are quality control data for a manufacturing
process at Bensdork Chemical Company. The data show the temperature
in degrees centigrade at five points in time during a manufacturing
cycle.
Sample
x
R
1
95.72
1.0
2
95.24
0.9
3
95.18
0.8
4
95.46
0.4
5
95.46
0.5
6
95.32
1.1
7
95.40
0.8
8
95.44
0.3
9
95.08
0.2
10
95.50
0.6
11
95.80
0.6
12
95.22
0.2
13
95.60
1.3
14
95.22
0.4
15
95.04
0.8
16...
The following are quality control data for a manufacturing process at Kensprt Chemical Company. The data...
The following are quality control data for a manufacturing
process at Kensprt Chemical Company. The data show the temperature
in degrees centigrade at five points in time during the
manufacturing cycle. The company is interested in using quality
control charts in monitoring the temperature of its manufacturing
cycle. Construct an X bar and R chart and indicate what its tells
you about the process.
Sample X
bar R
1
95.72 1.0
2
95.24 .9
3
95.38 .8...
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