The time to failure for an electronic device is measured as with different operation temperatures and...

The time to failure for an electronic device is measured as with different operation temperatures and humidity levels. The following data is obtained.

Is there a difference in mean life with different temperature and humidity? Is there an interaction between temperature and humidity? Complete the below table to support your conclusions.

	Temperature 290 K	Temperature 320 K	Temperature 360 K
Humidity 50%	130, 155, 74, 180	34, 40, 80, 75	20, 70, 82, 58
Humidity 70%	150, 188, 159, 126	136, 122, 106, 115	25, 70, 58, 45
Humidity 90%	138, 110, 168, 160	174, 120, 150, 139	96, 104, 82, 60

	Sum of squares	Degrees of freedom	Mean sum of squares	F	Critical F for 95% prob	Conclusion
Humidity	10683
Temperature	39118
Hum x Temp	9613
Error	18230

Expert Solution

orchestra answered 1 year ago

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